Techniques and applications of SEM moiré and AFM moiré

In Collections: Electronic Theses & Dissertations

Copyright Status: In Copyright

Material Type: Theses

Authors: Chen, Hua-Tang

Date: 2001

Subjects: Atomic force microscopy
Deformations (Mechanics)--Measurement
Scanning electron microscopes

Program of Study: Material Science and Mechanics

Degree Level: Doctoral

Language: English

Pages: xvi, 145 pages